SPIE Optical Metrology 2013

Organization: SPIE

Venue: International Congress Centre Munich - ICM

Location: Munich, Germany

Event Date/Time: May 13, 2013 End Date/Time: May 16, 2013
Registration Date: May 15, 2013
Paper Submission Date: Mar 11, 2013
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The only conference in Europe to bring together scientists, engineers, researchers, and product developers engaged in optical metrology, art conservation, and multimedia.


This symposium addresses the role of lasers in the following areas:

 + Optical Measurement Systems for Industrial Inspection

 + Modeling Aspects in Optical Metrology

 + Optics for Arts, Architecture, and Archaeology

 + Videometrics, Range Imaging and Applications

 + Optical Methods for Inspection, Characterization and Imaging of Biomaterials

 + Automated Visual Inspection


Co-located with Laser World of Photonics 2013 in Munich, Germany, this symposium provides an excellent opportunity to connect with engineers, researchers, and developers from Europe and beyond.



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Additional Information

Venue: ICM Munich Germany