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Welcome to VTS-2002, the twentieth in a series of annual symposia that explore the state-of-the-art,
and introduce innovative approaches, in the testing of electronic circuits and systems. The complexity of
current generation ICs, combined with rapidly developing high density, high speed packaging and
reduced design cycle time, has made it extremely difficult and expensive to comprehensively test
electronic systems, and diagnose failed parts using traditional methods. This situation worsens as we
move toward nanometer technologies. The reduced device geometries, increased operating speed and
very low power supply levels, are reducing noise margins and component reliability, complicating defect
behavior and increasing the impact of timing, cross talk, transient, and other spurious faults. There is
hence a great need for innovative advances in test and diagnosis methodologies to cope with these
problems.
Many creative and novel ideas and approaches to the current and future test-related problems are
explored and analyzed in the papers to be presented and discussed at VTS2002.
The two-and-a-half day technical program will include a keynote presentation, invited talks by leading
test specialists from industry and academia, presentations of novel ideas in regular papers and special
sessions (panels, embedded tutorials, hot topics, and open projector/microphone discussions). A wide
range of interests are expected to be covered in VTS 2002.
The TTTC Tutorials Group will offer four full day tutorials in state-of-the-art topics in test through the
Test Technology Education Program (TTEP). This provides opportunities for design and test
professionals to update their knowledge-base in test, and earn official accreditation from the TTTC.
This year again, popular day-long TTTC workshops are being held in conjunction with VTS2002. In
addition, a number of standardization Working Groups and IEEE Fringe Meetings will take place in
conjunction with VTS-2002.
The social program in VTS has traditionally provided an opportunity for closer interactions and informal
technical discussions. The attractive city of Monterey, California, is expected to provide an attractive
setting for this year's participants.
The IEEE Computer Society and its Test Technology Technical Council are sponsors of VTS 2002.
We hope that you will find VTS-2002 interesting, thought-provoking, rewarding, and fun.
Joan Figueras
General Chair
Univ. Politˆcnica de Catalunya
Dept. Eng. Electrønica
Diagonal, 647
E-08028 Barcelona
Spain
T: +34-93-401-6603
E: figueras@eel.upc.es
Andre Ivanov
Program Co-Chair
University of British Columbia
Dept. of ECE
2356 Main Mall
Vancouver, BC, V6T 1Z4,
Canada
T: +1-604-822-6936
E: ivanov@ece.ubc.ca
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