Applications of Linear and Area Detectors for X-ray and Neutron Diffraction and Spectroscopy (ALADINUS)

Venue: Warsaw University of Technology

Location: Warsaw, Poland

Event Date/Time: Sep 06, 2004 End Date/Time: Sep 10, 2004
Registration Date: Aug 15, 2004
Early Registration Date: Jul 31, 2004
Abstract Submission Date: Jul 31, 2004
Paper Submission Date: Sep 15, 2004
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"Applications of Linear and Area Detectors for X-ray and Neutron Diffraction and Spectroscopy" organized as Symposium D in the frame of EMRS Fall Meeting, Warsaw, 6-10 September 2004

There is a permanently growing need of studying the properties of materials and devices in a small spatio-temporal scale and with good energy resolution. Studies of such kind became possible owing to development of modern position sensitive (PSD) detectors installed at classical and synchrotron radiation as well as neutron sources. Unique properties of linear and area detectors permit for collecting data with speed and quality much better in respect to any classical detector, making that many applications in materials science, physics, chemistry, crystallography, geology, medicine, biology and astrophysics have been found. The continued progress in development of such detectors leads to improvement of existing materials-characterisation methods and to creation of new ones. In a connection with development of intense radiation sources, the in-situ time-resolved studies of phase transitions, the chemical reactions and other fast processes deciding about the material properties, can be studied. The observed progress would not be possible without work of scientist and technologists on detector materials, on physical principles of the detection processes, on fast low-noise electronics and hardware/software systems permitting collection and processing of huge amount of data. The scope of the symposium will cover the detectors used for detection of X-rays and neutrons in the domains of diffraction and spectroscopy methods of studies of materials properties: crystal structure, ordering, defects and electronic structure. Emphasis will be put on the detecting tools applicable with synchrotron radiation sources, as justified by fast development of these sources.

The meeting is thought to be especially valuable because of an opportunity given for users of such detectors to meet with those working on physics of detection process, with detectors producers and with authors of software. Exchanging ideas within this broad community is thought to be fruitful for future studies in materials science, where the use of PSD detectors is permanently growing.

The aim of the Symposium is to give an overview of the currently used LADs, their construction, methods of data processing as well as to inform about fields of their application. It will cover the detectors used for detection of X-rays and neutrons in diffraction and spectroscopy methods of studies of materials properties: crystal structure, atomic ordering, defects and electronic structure. In particular, the Symposium will:
· Present a large variety of applications of linear and area detectors in materials science in studies involving X-ray and neutron diffraction and spectroscopy,
· Present applications of position sensitive detectors as tools for studies of condensed matter, biological and medical materials,
· Discuss and compare the classical and new materials used for detector construction,
· Identify and discuss how to overcome technological and scientific barriers in this field,
· Discuss the current physical limits of detector construction influencing their energy and spatial resolution, noise, counting rate and efficiency,
· Present and review the recent advances and future limits in the development of linear and area detectors
· Provide a common forum for discussion what the materials science can do for detector development and how the progress in detectors technology influences the materials science.

· Detector design:
o physics of detector design,
o fast scintillators,
o state-of-the-art area and linear detectors for X-ray and neutron detection,
o ultrafast x-ray detectors and imaging systems,
o new trends, new concepts, new detector materials,
o future developments and perspectives.
· Data collection and analysis:
o image analysis,
o data reduction,
o advanced software for data processing.
· Applications of X-ray and neutron position sensitive detectors:
o in powder, single-crystal and thin-film diffraction studies,
o in high-pressure crystallography,
o in protein crystallography,
o in neutron and soft/hard X-ray spectroscopy,
o for nuclear resonant scattering,
o in time-resolved studies of materials processing, crystal growth etc.,
o in determination of crystal structure, local structure and defect structure,
o in materials science (phase transitions, stress studies, defectoscopy),
o in structural biology,
o for imaging spectrometry in space
· Imaging:
o in X-ray microscopy and related techniques (holography, tomography, nanotomography),
o of structure and strain of textured materials,
o for medical applications.

Symposium is organised by:
· Wojciech Paszkowicz, Institute of Physics, Polish Academy of Sciences, Warsaw, Poland
· Juergen Haertwig, European Synchrotron Radiation Facility, Experiments Division, Grenoble, France
· Krystyna Lawniczak-Jablonska, Institute of Physics, Polish Academy of Sciences, Warsaw, Poland
· Paul Siffert, CNRS Laboratoire de Physique et Applications de Semiconducteurs (PHASE), Strasbourg, France
· Thomas Wroblewski, DESY, HASYLAB, Hamburg, Germany
· AGH University of Science and Technology, Faculty of Physics and Nuclear Techniques, Cracow, Poland

Scientific Committee:
· A. Burian, University of Silesia, Katowice, Poland,
· F. Beckmann, Institute for Materials Research, GKSS-Res. Center, Hamburg, Germany
· R.J. Cernik, Daresbury Laboratory, Daresbury, U.K.,
· W. D¹browski, AGH University of Science and Technology, Cracow, Poland,
· D.L. Ederer, OBES, Washington, USA
· H. Fuess, DTU Darmstadt, Germany,
· J.H. Je, Pohang Univ. of Science & Technoloogy, South Korea
· M.M. Kocsis, ESRF, Grenoble, France,
· W. Minor, University of Virginia, Charlottesville, USA,
· R.J. Nelmes, University of Edinburgh, Scotland,
· A. Pietraszko, Institute of Low Temperature & Structural Research, Wroc³aw, Poland,
· R. Przenios³o, Warsaw University, Warsaw, Poland,
· P.A. Rodnyi, St. Petersburg State Polytechnical University, St. Petersburg, Russia,
· A.J. Wojtowicz, N. Copernicus Univ., Toruñ, Poland.
Lecturers and tentative invited-lecture titles

1. High-resolution imaging of engineering materials with laboratory sources and synchrotron radiation
Tilo Baumbach
Forschungszentrum Karlsruhe, Karlsruhe, Germany

2. GaAs and SiC based position sensitive detectors
Giuseppe Bertuccio
Politecnico di Milano, Milano, Italy

3. Large area X-ray detectors at the Swiss Light Source
Eric Eikenberry
Paul Scherrer Institute, Villigen, Switzerland

4. Materials for semiconductor detectors
Michael Fiederle
Univ. Freiburg, Freiburg, Germany

5. High-resolution soft X-ray spectrometer using 2D superconducting tunnel junctions
Stephan Friedrich
Lawrence Berkeley Laboratory, Livermore, CA, USA

6. Towards high-rate and high-resolution time-of-flight area detectors for spallation neutron sources like ESS
Burckhard E. Gebauer
Hahn Meitner Institute, Berlin, Germany

7. Medical (quantum) imaging with 2D detectors
Juergen Giersch
Physics Institute of the University of Erlangen, Germany

8. Area detectors for synchrotron radiation detection - applications in crystallography
Heinz Graafsma
ESRF, Grenoble, France

9. Using FIT2D software for data analysis (tentative title)
Andy P. Hammersley
ESRF, Grenoble, France

10. Application of a TOF detector for pulsed neutrons diffraction at Rutherford Appleton Laboratory
Alex C. Hannon
Rutherford Appleton Laboratory, Oxon, UK

11. Past and present of semiconductor detectors
Erik H.M. Heijne
CERN, Geneva, Switzerland

12. Real-time radiology in micro and nano scale
Yeukuang Hwu
Academia Sinica, Taipei, Taiwan

13. Trends in 2D detectors for particle physics and imaging applications
Hans Krueger
Univ. Bonn, Bonn, Germany

14. X-ray holography using area detectors
Andrea Lausi
Sincrotrone Trieste, Trieste, Italy

15. X-ray imaging detectors in space
Gerhard Lutz
Max Planck Institute of Physics and Astrophysics, Munich, Germany

16. 3D position sensitive detectors for pattern recognition applications
Rodrigo Martins
FCT-UNL and CEMOP-UNINOVA, Caparica, Portugal

17. Accuracy of diffraction data collected at one-dimensional PSDs - application for thin epitaxial layer systems (tentative title)
Olivier Masson
Univ Limoges/CNRS, Limoges, France

18. Ttitle to be specified
John Morse
ESRF, Grenoble, France

19. New large area array detector for protein crystallography at the APS
Istvan Naday
Argonne Natl. Laboratory, Argonne, IL, USA

20. Position sensitive detectors in protein crystallography
Zbyszek Otwinowski
University of Texas, Dallas, TX, USA

21. 2D detectors technology and optics - relations to Nature
Jerzy B. Pe³ka
Institute of Physics PAS, Warsaw, Poland

22. Application of PSDs in powder diffraction
Jerzy Pielaszek
Institute of Physical Chemistry PAS, Warsaw, Poland

23. Application of state-of-the-art 2D detectors in structural biology
Jasper R. Plaisier
Leiden University, Leiden, Netherlands

24. X-ray imaging using 2D semiconductor detectors
Jean-Pierre Ponpon
CNRS, PHASE Laboratory, Strasbourg, France

25. Detectors for energy dispersive EXAFS experiments
Giuseppe Salvini
DaresburyLaboratory, Warrington, UK

26. Novel materials and concepts for neutron-image plates
Michael Schlapp
Darmstadt Univ. of Technology, Darmstadt, Germany

27. High rate X-ray detectors for X-ray scattering, EXAFS and microscopy
(to be confirmed )

28. Nanotomography employing asymmetrical Bragg diffraction
Marco Stampanoni
Paul Scherrer Institute, Villigen, Switzerland

29. High-pressure study on iodine and several metallic elements (to be confirmed)

30. CMOS Monolithic Active Pixel Sensors for Scientific Application
Renato Turchetta
Rutherford Appleton Laboratory, Oxon, UK

The proceedings of Symposium D will be published in Nuclear Instruments and Methods in Physics Research A.

Contact address:

Dr. Wojciech Paszkowicz
Institute of Physics, Polish Academy of Sciences
Al. Lotnikow 32/46
02-668 Warsaw, Poland
phone OFFICE:
prefix 8436034, 8436601-3301, 8437001---3301, FAX: 8430926
prefix= (01033 22) from Poland, (+48 22) from abroad


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