SPIE Europe International Symposium Optical Metrology 2005

Venue: ICM—International Conference Center

Location: Munich, Germany

Event Date/Time: Jun 13, 2005 End Date/Time: Jun 17, 2005
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Come to Munich to meet with scientists, engineers, researchers, and applications and product developers in the field of optics and laser applications in metrology and art and archaeology conservation. Co-located with Laser 2005 in Munich, Germany, this symposium will address the role of lasers in the following areas: Optical Measurement Systems for Industrial Inspection; Optical Methods for Arts and Archaeology; Micro- and Nano-Metrology.