SPIE Europe International Symposium Optical Metrology 2005

Venue: ICM—International Conference Center

Location: Munich, Germany

Event Date/Time: Jun 13, 2005 End Date/Time: Jun 17, 2005
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Description

Come to Munich to meet with scientists, engineers, researchers, and applications and product developers in the field of optics and laser applications in metrology and art and archaeology conservation. Co-located with Laser 2005 in Munich, Germany, this symposium will address the role of lasers in the following areas: Optical Measurement Systems for Industrial Inspection; Optical Methods for Arts and Archaeology; Micro- and Nano-Metrology.

Venue