Event Date/Time: May 07, 2006 End Date/Time: May 10, 2006
Registration Date: May 10, 2006
Early Registration Date: Apr 07, 2006
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Description

The conference and exhibition focuses on the concerns of professionals in the fields of contamination control, product reliability, and design, test, and evaluation. ESTECH 2006 is an excellent opportunity for professionals to meet and do business with key people in the international community of environmental sciences. Attendees come from around the world for the technical expertise presented at the ESTECH conference and exhibition.

For design, test, and evaluation professionals, several new sessions/workshops will be added to the schedule. One session/workshop will be a panel discussion about the development of document MIL-STD-810G. The others include Aging Air and Ground Vehicles, Time Waveform Replication, Certifying Laboratories to ISO #17025, and UV Weathering.

Three new sessions/workshops will be presented for contamination control professionals to complement the current program: a session on the new industry Nanotechnology will be discussed; a case study related to silicon-related contamination of garments; and a review of ISO 14644-4 Design, Construction, and Start-Up.

Founded in 1953, IEST is an international technical society of engineers, scientists, and educators that serves its members and the industries they represent (simulating, testing, controlling, and teaching the environments of earth and space) through education and the development of recommended practices and standards.

IEST is an ANSI-accredited standards-developing organization; Secretariat of ISO/TC 209 Cleanrooms and associated controlled environments; Administrator of the ANSI-accredited US TAG to ISO/TC 209; and a founding member of the ANSI-accredited US TAG to ISO/TC 229 Nanotechnologies.

Venue

Additional Information

Online registration and the advance program are now available. Only four spaces left to exhibit!

Types