Call for Papers Metromeet 2009 5th International Conference on Industrial Dimensional Metrology (Metromeet 2009)

Venue: Euskalduna Conference Palace and Conference Hall

Location: Bilbao, Vizcaya, Spain

Event Date/Time: Mar 26, 2009 End Date/Time: Mar 27, 2009
Registration Date: Mar 25, 2009
Early Registration Date: Jul 01, 2008
Abstract Submission Date: Sep 18, 2008
Paper Submission Date: Sep 18, 2008
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METROMEET is a unique event and the most important conference in the sector of industrial dimensional metrology. There is only one moment a year where the international industrial dimensional metrology professionals meet; at METROMEET. For your company a perfect chance to be part of this unique event.

METROMEET will take place in the beautiful city Bilbao at the award winning Conference Centre Euskalduna

METROMEET will show to the experts of the sector the newest working methods and formulas that improve your industrial process and the productivity of your company. During the two days, international leaders in the Industrial Dimensional Metrology sector will show you how to improve the quality of your product and the efficiency of its production.


Avda.Abandoibarra, 4 - 48011 Bilbao

Additional Information

Send us your summary of the presentation before the 18th of September 2008. The best speaker of the Conference will receive an award for METROMEET 2009 Best Paper. Take part of this international event! The abstract selected by the Committee will be shown in September. You can send all the documentation by e-mail ( or using the form you will find in the Submit Abstract page. You can find here interesting information for the speakers There are lectures of two different kinds: Tutorials Tutorials offer you insight into the technologies, tools, instruments and working methods showing clearly and concise the practical aspects involved in their implementation. Tutorials will last 1hour and 45mins with 15 minutes for questions. Tracks On the other hand presentations discuss current topics of Industrial Metrology, State of the Art, problems and solutions, quality requirements, norms, etc. Presentations will last 30 minutes with 15 minutes for questions. Topics for METROMEET Academic Education in Metrology Acreditation and Certification Advances of micro- and nanometrology Future trends in metrological R&D GD & T (dimension and tolerance) Latest developments and solutions in the area of optical non-contact measurement and 3D digitalisation systems Measurement problems of large work pieces and their solutions Methods, organisation and best practices in the area of industrial metrology Metrology and economics New developments in measurement instruments New developments in Virtual Metrology Overview of industrial process quality requirements and metrology-based process improvements Recent developments in the area of metrological software Solutions for in-line inspection State of the art and challenges of multi-sensor coordinate metrology Uncertainty, traceability and reliability of measurements with CMMs