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| Papers |
September 18, 2008
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| Category |
Science: Engineering
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| Category 2 |
Science: Nanotechnology
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| Category 3 |
Science: Technology
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| Contact |
Carretera de Asusa 6
48930 Getxo
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| Description |
METROMEET is a unique event and the most important conference in the sector of industrial dimensional metrology. There is only one moment a year where the international industrial dimensional metrology professionals meet; at METROMEET. For your company a perfect chance to be part of this unique event.
METROMEET will take place in the beautiful city Bilbao at the award winning Conference Centre Euskalduna
METROMEET will show to the experts of the sector the newest working methods and formulas that improve your industrial process and the productivity of your company. During the two days, international leaders in the Industrial Dimensional Metrology sector will show you how to improve the quality of your product and the efficiency of its production.
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| Additional Information |
Send us your summary of the presentation before the 18th of September 2008.
The best speaker of the Conference will receive an award for METROMEET 2009 Best Paper.
Take part of this international event! The abstract selected by the Committee will be shown in September.
You can send all the documentation by e-mail (info@metromeet.org) or using the form you will find in the Submit Abstract page.
You can find here interesting information for the speakers
There are lectures of two different kinds:
Tutorials
Tutorials offer you insight into the technologies, tools, instruments and working methods showing clearly and concise the practical aspects involved in their implementation. Tutorials will last 1hour and 45mins with 15 minutes for questions.
Tracks
On the other hand presentations discuss current topics of Industrial Metrology, State of the Art, problems and solutions, quality requirements, norms, etc.
Presentations will last 30 minutes with 15 minutes for questions.
Topics for METROMEET
Academic Education in Metrology
Acreditation and Certification
Advances of micro- and nanometrology
Future trends in metrological R&D
GD & T (dimension and tolerance)
Latest developments and solutions in the area of optical non-contact measurement and 3D digitalisation systems
Measurement problems of large work pieces and their solutions
Methods, organisation and best practices in the area of industrial metrology
Metrology and economics
New developments in measurement instruments
New developments in Virtual Metrology
Overview of industrial process quality requirements and metrology-based process improvements
Recent developments in the area of metrological software
Solutions for in-line inspection
State of the art and challenges of multi-sensor coordinate metrology
Uncertainty, traceability and reliability of measurements with CMMs
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