4th International Conference on Optical Measurement Techniques for Structures and Systems (OPTIMESS2009)
Event Date/Time: Sep 17, 2008 | |
Abstract Submission Date: Jan 15, 2009 |
Description
At OPTIMESS a selection of top specialists in the field will present keynote lectures to bring a state of the art. Free contributions for 20 minute oral presentations or posters are welcomed in all topics dealing with optical measurement techniques and their applications. An exhibition held in conjunction with the conference will provide a unique opportunity to gain hands-on experience with the newest and most advanced optical measurement instrumentation products.
We are looking forward to meeting you in Antwerp!
Joris Dirckx Steve Vanlanduit
Jan Buytaert Patrick Guillaume