Atmospheric radiation and its effect on microelectronics-based systems can result in instantaneous malfunction, known as single event effects. Single event effects or ‘cosmic radiation’ can impact upon the reliability of products and has serious implications for equipment used in safety critical applications and environments.

With electronic devices becoming ever smaller and thus more sensitive to external influences, there is increasing concern in many industries regarding the effect of cosmic radiation on these devices.

Programmes have been funded by several military and civil organisations to better understand the impact on electronics systems and how to mitigate this risk but there is still the need for an industry-wide appreciation and approach to the problem.

Bob Gregory of Rolls Royce will open this must-attend seminar. This seminar will also give delegates a chance to question the experts in discussion panels and question and answer sessions.

Topics covered include:

Identifying the challenges
Measuring, testing and screening
Design solutions: ensuring reliability and accommodating SEE