SPIE Europe Optical Metrology 2009 (EOM09)

Venue: International Conference Centre Munich

Location: Munich, Germany

Event Date/Time: Jun 14, 2009 End Date/Time: Jun 18, 2009
Registration Date: Jun 15, 2009
Early Registration Date: May 30, 2009
Abstract Submission Date: Jan 26, 2009
Paper Submission Date: Apr 06, 2009
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Description

SPIE Europe Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.
Co-located with Laser World of Photonics 2009 in Munich, Germany, this symposium will address the role of lasers in the following areas:
• Optical Measurement Systems for Industrial Inspection
• Modeling Aspects in Optical Metrology
• O3A: Optics for Arts, Architecture, and Archaeology
Plan to participate by submitting an abstract or attending this essential event for optical metrology.

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