SPIE Europe Optical Metrology 2009 (EOM09)
Event Date/Time: Jun 14, 2009 | End Date/Time: Jun 18, 2009 |
Registration Date: Jun 15, 2009 | |
Early Registration Date: May 30, 2009 | |
Abstract Submission Date: Jan 26, 2009 | |
Paper Submission Date: Apr 06, 2009 |
Description
Co-located with Laser World of Photonics 2009 in Munich, Germany, this symposium will address the role of lasers in the following areas:
• Optical Measurement Systems for Industrial Inspection
• Modeling Aspects in Optical Metrology
• O3A: Optics for Arts, Architecture, and Archaeology
Plan to participate by submitting an abstract or attending this essential event for optical metrology.