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Fibres present massive challenges and opportunities for micro and nano technologies. These challenges are not in the manufacturing of the fibres but in the control and understanding of their behaviour.
This one-day workshop will focus on the many challenges of fibre analysis at the micro and nano-scale using state-of-the art surface chemical analysis, including SIMS, XPS and SPM techniques. Topics include fundamental effects of topography in SIMS and XPS, AFM nanomechanics, frictional force microscopy, multivariate analysis and important applications in industry.
This workshop will bring together leading researchers and practical analysts from industry and academia for discussions on the latest developments. Recommendations and guidance for reliable and robust measurements will be presented.
The workshop is being held in conjunction with UK Surface Analysis Forum (www.uksaf.org) which will be held at the same venue on the preceding day (Wednesday, 2nd July 2008).
Conference Venue
The meeting will be held at the University of Ulster, Jordanstown campus, which is a few minutes from Belfast, Northern Ireland and approximately 25 minutes from both Belfast City and Belfast International airports.
Call for Papers
Oral and poster contributions are invited on all aspects related to the meeting.
Abstracts should be emailed to charles.clifford@npl.co.uk by 31st March 2008.
Confirmed Speakers include:
Professor Graham Leggett, University of Sheffield, UK
Frictional force microscopy and the nano-analysis of fibres
Dr Chris Byrne, TechniTex Faraday Ltd
Technical textiles: state of art, measurement issues, and future applications
Dr Peter Cumpson, National Physical Laboratory, UK
Rapid analysis of layer thickness on fibre samples by X-ray photoelectron spectroscopy images using a Nomogram
Dr Ian Fletcher, Intertek MSG, UK
Analysing real-life fibre samples
Chris Boardman, Unilever, UK
How surface analysis can help in designing new laundry products
Scientific Organising Committee
Dr Charles Clifford, NPL
Prof Peter Doyle, Unilever, UK
Dr Ian Fletcher, Intertek, UK
Dr Ian Gilmore, NPL
Joanna Lee, NPL
Prof Graham Leggett, Sheffield University, UK
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