22nd IFIP International Conference on Testing Software and Systems (formerly TestCom/FATES) (ICTSS 2010)

Venue: Natal

Location: Natal, Rio Grande do Norte, Brazil

Event Date/Time: Nov 08, 2010 End Date/Time: Nov 10, 2010
Abstract Submission Date: Apr 26, 2010
Paper Submission Date: May 03, 2010
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22nd IFIP International Conference on Testing Software and Systems (ICTSS)

November 8 - 10, 2010, Natal, Brazil



ICTSS is the merge of the 22nd IFIP Int. Conference on Testing of
Communicating Systems (TESTCOM) and the 10th Int. Workshop on Formal
Approaches to Testing of Software (FATES). ICTSS is a forum for
researchers, developers, testers, and users to review, discuss, and learn
about new approaches, concepts, theories, methodologies, tools, and
experiences in the field of testing of general software and systems. ICTSS
will be co-located with 13th Brazilian Symposium on Formal Methods and 4th
Brazilian Workshop on Software Testing.

* Aspects of testing: test derivation, test selection, test coverage, test
implementation and execution, test result analysis, test oracles, test
management, monitoring and run-time verification, testing frameworks

* Model-based testing using automata, state machines, process algebra,
logics, SDL, UML, Markov-chains, and other formalisms

* Various types of testing: functional, interoperability, performance,
conformance, security, reliability, robustness, etc

* Application specific testing, e.g., testing of communicating systems and
protocols, middleware, networks, web services and applications, wireless
applications, control systems, business information systems, embedded and
real-time software

* Tools supporting testing activities

* Case studies and industrial applications of testing methodologies and
testing tools

* Full research and industrial papers (max. 16 pages). Research papers
should contain theory- or application-oriented results which must be
original, significant, and sound; they will undergo a usual reviewing
process.  Industrial papers should emphasize practical software testing
and/or report open challenges; they will undergo a separate reviewing
process. Full papers will be published in LNCS (guidelines:
http://www.springer.de/comp/lncs/authors.html). The authors of best papers
will be invited to submit extended versions of their papers for a special
issue of an international journal (under negotiation).

* Short papers (max. 6 pages) describing recent research activities,
practical experience, and preliminary results that are worth discussing.
Short papers will be published as a Technical Report of CRIM with an ISBN
number available online.

* Tutorial proposals (3 pages).

April 26, 2010: Abstract submission
May 3, 2010: Full paper submission
July 1, 2010: Notification of acceptance
July 15, 2010: Camera-ready version

July 19, 2010: Short paper submission
September 9, 2010: Notification of acceptance

July 19, 2010: Tutorial proposals
August 9, 2010: Notification of acceptance

Alexandre Petrenko, CRIM, Canada
Jose Carlos Maldonado, U of Sao Paulo, Brazil
Adenilso Simao, U of Sao Paulo, Brazil

Paul Baker, Motorola, UK
Antonia Bertolino, ISTI-CNR, Italy
Roberto S. Bigonha, Federal U of Minas Gerais, Brazil
Gregor v. Bochmann, U of Ottawa, Canada
Ana R. Cavalli, Telecom SudParis, France
John Derrick, U of Sheffield, UK
Sarolta Dibuz, Ericsson, Hungary
Khaled El-Fakih, American U of Sharjah, UAE
Gordon Fraser, Saarland U, Austria/Germany
Wolfgang Grieskamp, Microsoft Research, USA
Roland Groz, Grenoble Institute of Technology, France
Toru Hasegawa, KDDI R&D Labs., Japan
Klaus Havelund, Jet Propulsion Laboratory, USA
Rob Hierons, Brunel U, UK
Teruo Higashino, Osaka U, Japan
Dieter Hogrefe, U of Gottingen, Germany
Antti Huima, M.Sc. Tech, Finland
Thierry Jeron, IRISA Rennes, France
Ferhat Khendek, Concordia U, Canada
Myungchul Kim, ICU, Korea
Hartmut Konig, BTU Cottbus, Germany
Victor V. Kuliamin, ISP RAS, Russia
David Lee, Ohio State U, USA
Bruno Legeard, Smartesting, France
Patricia Machado, Federal U of Campina Grande, Brazil
Giulio Maggiore, Telecom Italia Mobile, Italy
Jose Carlos Maldonado, U of Sao Paulo, Brazil
Eliane Martins, U of Campinas, Brazil
Ana Cristina de Melo, U of Sao Paulo, Brazil
Brian Nielsen, U of Aalborg, Denmark
Daltro Jose Nunes, Federal U of Rio Grande do Sul, Brazil
Doron Peled, U of Bar-Ilan, Israel
Alexandre Petrenko, CRIM,Canada
S Ramesh, General Motors India Science Lab, India
Augusto Sampaio, Federal U of Pernambuco, Brazil
Ina Schieferdecker, Fraunhofer FOKUS, Germany
Adenilso Simao, U of Sao Paulo, Brazil
Kenji Suzuki, U of Electro-Communications, Japan
Jan Tretmans, Embedded Systems Institute, The Netherlands
Andreas Ulrich, Siemens AG, Germany
Hasan Ural, U of Ottawa, Canada
M. Umit Uyar, City U of New York, USA
Margus Veanes, Microsoft Research, USA
Cesar Viho, IRISA Rennes, France
Carsten Weise, RWTH Aachen, Germany
Burkhart Wolff, U of Paris-Sud, France
Nina Yevtushenko, Tomsk State U, Russia
Xia Yin, Tsinghua U, China

Marcel Oliveira, Federal U of Rio Grande do Norte, Brazil