2010 International Conference on Material and Manufacturing Technology (ICMMT 2010)

Venue: Chongqing

Location: Chongqing, China

Event Date/Time: Sep 17, 2010 End Date/Time: Sep 19, 2010
Registration Date: Jun 10, 2010
Paper Submission Date: May 10, 2010
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Description

2010 International Conference on Material and Manufacturing Technology (ICMMT 2010) will be held in Chongqing, China during September 17 - 19, 2010. The aim objective of ICMMT 2010 is to provide a platform for researchers, engineers, academicians as well as industrial professionals from all over the world to present their research results and development activities in Material and Manufacturing Technology. This conference provides opportunities for the delegates to exchange new ideas and application experiences face to face, to establish business or research relations and to find global partners for future collaboration. Submitted conference papers will be reviewed by technical committees of the Conference.

All accepted papers of ICMMT 2010 will be published by Advanced Materials Research Journal, which will be indexed by EI Compendex.

Venue

Additional Information

Topics of interest for submission include, but are not limited to: (01) Materials behavior (02) Casting and solidification (03) Powder metallurgy and ceramic forming (04) Surface, subsurface, and interface phenomena (05) Coatings and surface engineering (06) Composite materials (07) Materials forming (08) Machining (09) Nanomaterials and nanomanufacturing (10) Biomedical manufacturing (11) Environmentally sustainable manufacturing processes and systems (12) Manufacturing process planning and scheduling (13) Meso/micro manufacturing equipment and processes (14) Modeling, analysis, and simulation of manufacturing processes (15) Computer-aided design, manufacturing, and engineering (16) Semiconductor materials manufacturing (17) Laser based manufacturing (18) Precision molding processes (19) Joining processes (20) Rapid manufacturing technologies (21) Nontraditional manufacturing (22) Nanofabrication, nanometrology and applications (23) Metrology and measurement