International Youth Conference (Tutorial) “High-resolution microscopy” in the framework of Joint

Venue: Ural Federal University

Location: Ekaterinburg, Russia

Event Date/Time: Aug 20, 2012 End Date/Time: Aug 25, 2012
Registration Date: Aug 15, 2012
Early Registration Date: Aug 15, 2012
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Description

International Youth Conference (Tutorial) “High-resolution microscopy”
in the framework of Joint ISFD-11th-RCBJSF symposium

According to financial support of Russian Ministry of Education and Science we are pleased to offer you special tutorial part of Joint ISFD-11th-RCBJSF symposium:

Free part of the tutorial includes:
1. Monday, August, 20
Lectures on multiferroics and high resolution microscopy in ferroelectrics.
2. Tuesday, August, 21 – Friday, August, 24
Selected presentations of the Joint ISFD-11th-RCBJSF Symposium.
3. Friday, August, 24
Distant training.
4. Friday, August, 24 and Saturday, August, 25
Optional training in ten-person-groups on Nanoeducator-10.

Additional paid part with extra-fee 100 Euro of the tutorial includes:
5. Monday, August 20 – Saturday, August 25.
Short personal training on equipment of Ural Center of Joint Use “Modern Nanotechnology“ UrFU. Measurements can be made on your samples.

Tutorial lectures (Monday, August, 20):
• “Advanced Piezoresponse Force Microscopy for Nanoscale Studies of Ferroelectric Structures”
Alexei Gruverman, University of Nebraska, USA
• “Aberration-Corrected STEM and What It Can Do For Ferroelectrics“
Albina Y. Borisevich, Electron Microscopy Group, Oak Ridge National Laboratory, USA
• “Multiferroic and magnetoelectric materials”
Wolfgang Kleemann, University of Duisburg-Essen, Germany
• Title will be announced later
Vladimir Shvartsman, University of Duisburg-Essen, Germany
• A series of short lectures by nanotech equipment manufacturers

List of available equipment (in the framework of the short practical training):
• Probe NanoLaboratory NTEGRA-Prima, NT-MDT
Basic model - a multifunctional instrument to solve the routine problems related to scanning probe microscopy
• Probe NanoLaboratory NTEGRA-Aura, NT-MDT
SPM measurements in vacuum and controlled atmosphere
• Probe NanoLaboratory NTEGRA-Therma, NT-MDT
SPM measurements in wide temperature range
• Probe NanoLaboratory NTEGRA-Spectra, NT-MDT
Integration of SPM with confocal microscopy and Raman spectroscopy
• High vacuum SPM Solver HV-MFM, NT-MDT
SPM investigations in high vacuum conditions (up to 10-8 Torr) and rare gaseous unaggressive medium
• CrossBeam Workstation AURIGA, Carl Zeiss NTS
Scanning electron microscope with focused ion beam, electron backscatter diffraction (EBSD), energy-dispersive X-ray spectroscopy (EDS), local charge compensation, and E-beam lithography. Study of morphology, chemical and structural material properties in nanoscale
Young scientists under 35 can apply for free accommodation in UrFU hostels. The number of rooms is limited.

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